Atomic Force Microscope (Bruker Multimode 8)
Bruker Multimode 8 atomic force microscope system with a Veeco Nanoscope IIIa controller.
The Bruker Multimode 8 AFM system offers high-resolution imaging for both materials science and life science applications. The AFM is capable of imaging in Contact Mode, Tapping Mode and PeakForce Tapping. The instrument features multiple scanners that provide large scan ranges up to 125 µm on the XY axes and a Z range up to 5 µm.
The Bruker Multimode 8 AFM system offers high-resolution imaging for both materials science and life science applications. The AFM is capable of imaging in Contact Mode, Tapping Mode and PeakForce Tapping. The instrument features multiple scanners that provide large scan ranges up to 125 µm on the XY axes and a Z range up to 5 µm.